Image analysis for high brightness and fast changing industrial processes is proposed (tutorial codes are provided)

Image analysis for high brightness and fast changing industrial processes is proposed (tutorial codes are provided)

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物質理工学院 Saulius Juodkazis特任教授の共著

“Invasive and Non-Invasive Observation of Occluded Fast Transient Events: Computational Tools”

が、Photonics   に掲載されました。(DOI:10.3390/photonics8070253

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<Abstract>

Industrial processes involving thermal plasma such as cutting, welding, laser machining with ultra-short laser pulses (nonequilibrium conditions), high temperature melting using electrical discharge or ion-beams, etc., generate non-repeatable fast transient events which can reveal valuable information about the processes. In such industrial environments containing high temperature and radiation, it is often difficult to install conventional lens-based imaging windows and components to observe such events. In this study, we compare imaging requirements and performances with invasive and non-invasive modes when a fast transient event is occluded by a metal window consisting of numerous holes punched through it. Simulation studies were carried out for metal windows with different types of patterns, reconstructed for both invasive and non-invasive modes and compared. Sparks were generated by rapid electrical discharge behind a metal window consisting of thousands of punched through-holes and the time sequence was recorded using a high-speed camera. The time sequence was reconstructed with and without the spatio-spectral point spread functions and compared. Commented MATLAB codes are provided for both invasive and non-invasive modes of reconstruction.