Shunri Oda

1979-1986 Research Associate, Imaging Science and Engineering Laboratory, Tokyo Institute of Technology
1986-1995 Associate Professor, Department of Physical Electronics, Tokyo Institute of Technology
1995- Professor, Tokyo Institute of Technology

Field of Specialization
Electron Devices, Nanoelectronics

Laboratory for Future Interdisciplinary Research of Science and Technology(IIR, Tokyo Tech)

Research Hub Group:Materials and Devices international hub group

Research Highlights 

  • Fabrication of single electron transistors based on nano-crystalline silicon prepared by VHF plasma CVD(2000.07)
  • Observation of Pauli spin blockade in multiple coupled silicon quantum dots (2012.09)


  • January 2017
    Coherent control of interface-induced electronic resonance in a field-effect transistor was published in Nature Materials.

Selected Awards

  • 1983
    Tejima Research Awards
  • 1995
    ISTEC and MRS Performance Awards
  • 2002
    Fujino Research Awards
  • 2006
    IEEE Electron Devices Society Distinguished Lecturer
  • 2007
    Fellow, Japan Society of Applied Physics
  • 2012
    Fellow IEEE
  • 2016
    Best Paper Awards, Silicon Technology Division, Japan Society of Applied Physics

Selected Publications

  • J. O. Tenorio-Pearl, E. D. Herbschleb, S. Fleming, C. Creatore, S. Oda, W. I. Milne & A. W. Chin, Observation and coherent control of interface-induced electronic resonances in a field-effect transistor, Nature Materials, 16, 208-213, 2017.
  • G. Yamahata, T. Kodera, H. O. H. Churchill, K. Uchida, C. M. Marcus, and S. Oda, Magnetic field dependence of Pauli spin blockade: A window into the sources of spin relaxation in silicon quantum dots, Physical Review B, 86, 115322 (5 pages), 2012.
  • B. Pruvost,K. Uchida, H. Mizuta,S. Oda, Design of New Logic Architectures utilizing Optimized Suspended-Gate Single-Electron Transistors, IEEE Transactions on Nanotechnology, 9 (4), 504–512, 2010
  • K. Nishiguchi and S. Oda, Ballistic transport in silicon vertical transistors, Journal of Applied Physics, 92(3), 1399-1405, 2002